Data for the XRD, XPS, UV-Vis-NIR spectroscopy, SSMC and TRMC results, as well as the SEM images, in the main manuscript and Supporting Information under review in Journal of Materials Chemistry A.
The raw data were collected in the years 2024-2025, using various structural, compositional, and optoelectronic characterization methods on solution-based spin-coated mixed tin-lead (Sn-Pb) perovskite thin films with varying combinations and concentrations of tin fluoride (SnF2), guanidinium thiocyanate (GuaSCN), guanidinium iodide (GuaI), and lead thiocyanate (Pb(SCN)2) additives, alongside absorption spectroscopy analysis on perovskite precursor solutions. All measurements were conducted at room temperature, to study the separate and combined effect of the different additives. More specifically, all SSMC and TRMC measurements were conducted under nitrogen. The xy data obtained from X-ray diffraction (XRD), UV-Vis-NIR spectroscopy, and X-ray photoelectron spectroscopy (XPS) were imported into Igor Pro (Wavemetrics). In Igor Pro, these xy data are stored as "waves," corresponding to the values on the x and y axes in the plots. Data for Steady State Microwave Conductance (SSMC) and Time-Resolved Microwave Conductivity (TRMC) were collected directly as waves in Igor Pro on the computers connected to the respective microwave-based setups. Igor Pro was used to generate all data plots. The SEM micrographs were directly saved as .tiff files from the SEM software.
For further information on file formats and naming, the units and abbreviations used for all measured values and labels, and instructions for opening or modifying Igor Pro files, please refer to the README.pdf included in the dataset. It is strongly recommended to consult the corresponding manuscript once it is published (the corresponding DOI will be provided as soon as possible) for guidance on the files in these datasets, as each file name includes a reference to its associated figure. The main manuscript and Supporting Information contains details about the characterization instruments and additional data processing specifics.
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