cff-version: 1.2.0 abstract: "
This dataset includes data obtained from spectroscopic ellipsometry, transmittance, and X-ray diffraction measurements under the research "The formation of metallic domains by Anderson-Mott insulator-to-metal transition in photochromic yttrium oxyhydride films studied by in-situ spectroscopic ellipsometry". Raw and processing data of measurements can be found under the file "raw data_in-situ illumination ellipsometry" and "processing data_in-situ illumination ellipsometry".
" authors: - family-names: Wu given-names: Ziying orcid: "https://orcid.org/0000-0002-6817-2525" - family-names: Beek given-names: Melanie - family-names: Colombi given-names: Giorgio - family-names: Zhou given-names: Yilong - family-names: Chaykina given-names: Diana - family-names: Schreuders given-names: Herman - family-names: Brück given-names: Ekkes - family-names: Dam given-names: Bernard - family-names: Eijt given-names: Stephan title: "Data underlying the Chapter "The formation of metallic domains by Anderson-Mott insulator-to-metal transition in photochromic yttrium oxyhydride films studied by in-situ spectroscopic ellipsometry"" keywords: version: 1 identifiers: - type: doi value: 10.4121/1c931e2b-e24d-4f6b-bc9e-a6e9eac1282c.v1 license: CC BY-NC-SA 4.0 date-released: 2024-08-23