@misc{https://doi.org/10.4121/uuid:7f672638-66f6-4ec3-a16c-34181cc45202,
  doi = {10.4121/uuid:7f672638-66f6-4ec3-a16c-34181cc45202},
  url = {https://data.4tu.nl/articles/dataset/Data_underlying_the_paper_Quantitative_analysis_of_spectroscopic_Low_Energy_Electron_Microscopy_Data/12705857/1},
  author = {de Jong, Tobias A. and Jobst, J. (Johannes)},
  keywords = {Calibration data, Electron Spectroscopy, Graphene on Silicon Carbide, LEEM-IV, Low Energy Electron Microscopy, Material Science},
  title = {Data underlying the paper: Quantitative analysis of spectroscopic Low Energy Electron Microscopy Data},
  publisher = {4TU.Centre for Research Data},
  year = {2019},
  copyright = {CC0},
}