Raw data contained in paper "Multilayer precursors for enhanced Sm2+ and Tm2+ in SiAlO thin films prepared by magnetron sputtering"

doi:10.4121/14798358.v1
The doi above is for this specific version of this dataset, which is currently the latest. Newer versions may be published in the future. For a link that will always point to the latest version, please use
doi: 10.4121/14798358
Datacite citation style:
Bizinoto Ferreira Bosco, Giacomo; Biesen, J.K. van den; Boers, C.; Simone, G.; Kao, J. et. al. (2021): Raw data contained in paper "Multilayer precursors for enhanced Sm2+ and Tm2+ in SiAlO thin films prepared by magnetron sputtering". Version 1. 4TU.ResearchData. dataset. https://doi.org/10.4121/14798358.v1
Other citation styles (APA, Harvard, MLA, Vancouver, Chicago, IEEE) available at Datacite
Dataset
The contents of this dataset concern raw data files and scripts used to generate the figures 2, 3, 5 – 12, described in the paper "Multilayer precursors for enhanced Sm2+ and Tm2+ in SiAlO thin films prepared by magnetron sputtering". In this research work, the high concentration of undesired Sm3+ causes low absorption observed in SiAlO:Sm thin films prepared by magnetron sputtering. The article also proposes an alternative deposition process for obtaining Sm doped SiAlO layers with enhanced Sm2+ absorption by incorporating Sm by multilayer thin-film precursors composed of metallic Sm and SiAlO layers. Finally, it communicates Tm2+ PL and PLE data on SiAlO hosts. Each dataset and script needed to generate each figure are separated. The data was generated by UV-VIS transmittance, photoluminescence emission (PL) and excitation (PLE), and X-ray photoelectron spectroscopy (XPS) of the Sm's 3d5/2 edge. The data collection methods are described in the experimental section of the paper. PL and PLE data are given in .nc files, the analyzed results given by XPS are collected in .xls files, and the transmittance data are given as text files.
history
  • 2021-07-08 first online, published, posted
publisher
4TU.ResearchData
funding
  • Nederlandse Organisatie voor Weten- schappelijk Onderzoek (NWO) – Grant No. 680-91-201
organizations
TU Delft, Faculty of Applied Sciences, Department of Radiation Science and Technology

DATA

files (1)