Data underlying the PhD dissertation "Advanced Measurement Techniques for VNA Accuracy and Sensitivity Enhancement"

DOI:10.4121/6a523997-cd55-4700-b472-7d69783e4ef2.v1
The DOI displayed above is for this specific version of this dataset, which is currently the latest. Newer versions may be published in the future. For a link that will always point to the latest version, please use
DOI: 10.4121/6a523997-cd55-4700-b472-7d69783e4ef2
Datacite citation style:
Mubarak, Faisal Ali (2024): Data underlying the PhD dissertation "Advanced Measurement Techniques for VNA Accuracy and Sensitivity Enhancement". Version 1. 4TU.ResearchData. dataset. https://doi.org/10.4121/6a523997-cd55-4700-b472-7d69783e4ef2.v1
Other citation styles (APA, Harvard, MLA, Vancouver, Chicago, IEEE) available at Datacite

Dataset

Data underlying the PhD dissertation "Advanced Measurement Techniques for VNA Accuracy and Sensitivity Enhancement"


The data includes S-parameter measurement results acquired for calibration and uncertainty evaluation in connectorized and on-wafer systems. Furthermore, a collection of scripts (Matlab-based) is included for the evaluation and analysis of the measurement data.


History

  • 2024-09-05 first online, published, posted

Publisher

4TU.ResearchData

Organizations

TU Delft, Faculty of Electrical Engineering, Mathematics and Computer Science, Department of Microelectronics

DATA

Files (2)